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Power device electrical analysis instrument

Introduction

The purpose of the test is to provide detailed characteristics of the semiconductor device, so that the designer can accurately predict the behavior of the device in a steady state, and can assist the user in choosing the best device to use in his application.

Description

The measurement principle is to use the automatic curve tracer (ACT) to measure the electrical characteristics to quickly calculate the resistance value, thereby confirming the relationship between the circuits and detecting abnormalities in real time.

Spec :

  • Device Dynamic Analyzer On Package
  • Device dynamic analyzer on multi-module package
  • Wafer Probing Device Dynamics Analyzer
  • Switching On-Vg : 1V~12V for device benchmark
  • Switching Voltage : <800V
  • Switching Current : <10A
  • Switching Frequency : <500kHZ
  • Switching Duty : 10%~90%
  • Temperature : 25C~175C
  • Characterization Items : Dynamic Rdson (HSW, ZVS), Dynamic Rsdon (ZVS), Dynamic Vth, Dynamic Vsd, Dynamic HTOL (SALT), Pulse I-V…

Product Contact

Ryan Tsai

Technical Service Dept.
Sales Assistant Manager

TOPCO SCIENTIFIC CO.,LTD.

4F., No. 12, Industry E. 9th Rd., Science based Industrial park, Hsinchu City 300096, Taiwan
TEL: (03)564-2132 ext.3431
e-mail: ryan.tsai@topco-global.com

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