Power device electrical analysis instrument
The purpose of the test is to provide detailed characteristics of the semiconductor device, so that the designer can accurately predict the behavior of the device in a steady state, and can assist the user in choosing the best device to use in his application.
Production Intro
The measurement principle is to use the automatic curve tracer (ACT) to measure the electrical characteristics to quickly calculate the resistance value, thereby confirming the relationship between the circuits and detecting abnormalities in real time.
Device Dynamic Analyzer On Package
Device dynamic analyzer on multi-module package
Wafer Probing Device Dynamics Analyzer
Switching On-Vg : 1V~12V for devicebenchmark
- Switching Voltage :<800V
- Switching Current :<10A
- Switching Frequency :<500kHZ
- Switching Duty :10%~90%
- Temperature :25C~175C
- Characterization Items : Dynamic Rdson(HSW, ZVS), Dynamic Rsdon(ZVS), Dynamic Vth, Dynamic Vsd, Dynamic HTOL (SALT), Pulse I-V…
Product Contact
White Pai
- TOPCO SCIENTIFIC CO.,LTD.
- Assistant Manager
- Technical Service Dept.
7F.-6, No. 168, Anhe Rd., Xitun Dist., Taichung City 407148, Taiwan
TEL: (04)3503-5342 ext.67