SiC reclaim wafer
Regardless of poor quality polish SiC wafer, SiC epi wafer, or IC device SiC wafer, the surface defect and device pattern can be removed by claim process, and recover to epi ready quality.
Production Intro
Product Contact
Jason Wei
- TOPCO SCIENTIFIC CO.,LTD.
- Senior Director
- Advanced wafer & material Div., 2nd Business Unit
4F., No. 12, Industry E. 9th Rd., Science based Industrial park, Hsinchu City 300096, Taiwan
TEL: (03)564-2132 ext.3441